000 01209nam a2200325 a 4500
005 20250918130305.0
008 110408s2010 nyua 001 0 eng
020 _a9781606501948
_cRM233.94
039 9 _a201111301310
_bjamil
_c201111211420
_dbaizura
_c201110271618
_dfarid
_c201110271617
_dfarid
_y04-08-2011
_zfarid
040 _aAU@
_beng
_cAU@
_dUKM
090 _aTA455.C43C484
090 _aTA455.C43
_bC484
245 0 0 _aCharacterization of ceramics /
_ceditor , Ronald E. Loehman.
246 1 0 _aCharacterisation of ceramics.
260 _aNew York:
_bMomentum Press ,
_c2010
300 _axviii, 295 p. :
_bill. ;
_c25 cm
490 1 0 _aMaterials characterization series : surfaces, interfaces, thin films / series editors, C. Richard Brundle and Charles A. Evans.
504 _aIncludes index.
650 0 _aCeramic materials.
650 0 _aCeramics.
700 1 _aLoehman, Ronald E.
830 0 _aMaterials characterization series.
907 _a.b14993223
_b2021-05-28
_c2019-11-12
942 _c01
_n0
_kTA455.C43C484
914 _avtls003461482
990 _anm
991 _aFakulti Sains dan Teknologi - FST
998 _al
_b2011-08-04
_cm
_da
_feng
_gnyu
_y0
_z.b14993223
999 _c484105
_d484105