000 01243nam a2200337 a 4500
005 20250918130305.0
008 110408s2010 nyua 001 0 eng
020 _a9781606500507
_cRM233.94
039 9 _a201111211431
_bbaizura
_c201110271654
_dfarid
_c201110271610
_dfarid
_c201110271610
_dfarid
_y04-08-2011
_zfarid
040 _aDLC
_cDLC
_dUKM
090 _aQC374.C484
090 _aQC374
_b.C484
245 0 0 _aCharacterization of optical materials /
_ceditor, Gregory J. Exarhos ; series editor C. Richard Brundle and Charles A. Evans.
260 _aNew York:
_bMomentum Press ,
_c2010.
300 _axii, 211 p. :
_bill. ;
_c25 cm.
490 1 0 _aMaterials characterization series.
504 _aIncludes bibliographical references and index.
650 0 _aOptical materials.
650 0 _aOptical materials
_xSurfaces.
700 1 0 _aExarhos, Gregory J.
700 1 0 _aBrundle, C. Richard.
700 1 0 _aEvans, Charles A.
830 0 _aMaterials characterization series.
907 _a.b14993156
_b2021-05-28
_c2019-11-12
942 _c01
_n0
_kQC374.C484
914 _avtls003461475
990 _anm
991 _aFakulti Sains dan Teknologi - FST
998 _at
_b2011-08-04
_cm
_da
_feng
_gnyu
_y0
_z.b14993156
999 _c484098
_d484098