000			01612nam a2200445 a 4500
005			20250918124743.0
006			m d
007			cr nn 008maaau
008			101230s2010 mau s j eng d
020			_a9781441905529 (electronic bk.)
020			_a9781441905512 (paper)
035			_a(Springer)978-1-4419-0551-2
039		9	_y12-30-2010 _zmuhaimin
050	0	4	_aTK8320 _b.S86 2010
082	0	4	_a621.38153 _222
090			_aTK8320 _b.S957 2010
100	1		_aSun, Yongke.
245	1	0	_aStrain effect in semiconductors _h[electronic resource] : _btheory and device applications / _cby Yongke Sun, Scott E. Thompson, Toshikazu Nishida.
250			_aFirst.
260			_aBoston, MA : _bSpringer Science+Business Media, LLC, _c2010.
300			_axii, 350 p. : _bill., digital ; _c24 cm.
650		0	_aSemiconductors.
650		0	_aStrains and stresses.
650	1	4	_aEngineering.
650	2	4	_aElectronics and Microelectronics, Instrumentation.
650	2	4	_aSolid State Physics.
650	2	4	_aSpectroscopy and Microscopy.
650	2	4	_aOptical and Electronic Materials.
700	1		_aThompson, Scott E.
700	1		_aNishida, Toshikazu.
710	2		_aSpringerLink (Online service)
773	0		_tSpringer eBooks
856	4	0	_uhttps://eresourcesptsl.ukm.remotexs.co/user/login?url=http://dx.doi.org/10.1007/978-1-4419-0552-9
907			_a.b14896953 _b2023-02-07 _c2019-11-12
942			_n0 _kTK8320 .S957 2010
914			_avtls003451430
998			_ae _b2010-04-12 _cm _dz _feng _gmau _y0 _z.b14896953
999			_c476255 _d476255