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| 008 | 101227s2009 waua bi 001 0 eng | ||
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| 100 | 1 | _aHsieh, Jiang | |
| 245 | 1 | 0 |
_aComputed tomography : _bprinciples, design, artifacts, and recent advances / _cJiang Hsieh |
| 250 | _a2nd ed. | ||
| 260 |
_aHoboken, N.J. : _bWiley Interscience, _c2009 |
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| 300 |
_axiv, 556 p. : _bill. ; _c26 cm. |
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| 504 | _aIncludes bibliographical references and index | ||
| 530 |
_aOnline version available. _uhttp://dx.doi.org/10.1117/3.817303 |
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| 650 | 0 | _aTomography | |
| 650 | 2 | _aTomography, X-Ray Computed | |
| 650 | 2 |
_aTomography Scanners, X-Ray Computed _xtrends |
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| 650 | 2 |
_aTomography, X-Ray Computed _xinstrumentation |
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| 650 | 2 |
_aTomography, X-Ray Computed _xtrends |
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| 710 | 2 | _aSPIE (Society) | |
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_a.b14878094 _b2021-05-28 _c2019-11-12 |
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_c01 _n0 _kRC78.7.T6 H755 2009 3 |
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| 914 | _avtls003449443 | ||
| 991 | _aFakulti Kejuruteraan & Alam Bina | ||
| 991 | _aProgram Pengimejan, KKL | ||
| 998 |
_ad _at _b2010-01-12 _cm _da _feng _gwau _y0 _z.b14878094 |
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