| 000 | 00974nam a2200301 a 4500 | ||
|---|---|---|---|
| 005 | 20250918123732.0 | ||
| 008 | 101224s2010 xxka 001 0 eng | ||
| 020 |
_a9780080964546 (hbk.) : _cRM424.83 |
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| 039 | 9 |
_a201102081430 _bzabidah _c201101251052 _dfati _y12-24-2010 _zrahah |
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| 040 | _aUKM | ||
| 090 | _aT174.7.L434 3 | ||
| 090 |
_aT174.7 _b.L434 |
||
| 100 | 1 | _aLeach, Richard K. | |
| 245 | 1 | 0 |
_aFundamental principles of engineering nanometrology / _cProfessor Richard K. Leach |
| 260 |
_aOxford : _bWilliam Andrew/Elsevier, _c2010 |
||
| 300 |
_axxvi, 321 p. : _bill. ; _c24 cm. |
||
| 500 | _aIncludes index | ||
| 650 | 0 | _aNanotechnology | |
| 650 | 0 | _aMicrotechnology | |
| 650 | 0 | _aMetrology | |
| 907 |
_a.b14876231 _b2021-05-28 _c2019-11-12 |
||
| 942 |
_c01 _n0 _kT174.7.L434 3 |
||
| 914 | _avtls003449241 | ||
| 990 | _afka/za | ||
| 991 | _aFakulti Kejuruteraan & Alam Bina | ||
| 998 |
_al _b2010-11-12 _cm _da _feng _gxxk _y0 _z.b14876231 |
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| 999 |
_c474190 _d474190 |
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