000 01188nam a2200325 a 4500
005 20250918123713.0
008 101222s2010 flua b 001 0 eng
020 _a9781439825686 (hbk) 100869660
_cRM303.97
020 _a1439825688
039 9 _a201106241205
_bzabidah
_c201104200926
_dzabidah
_c201104121443
_drasyilla
_c201102161539
_didah
_y12-22-2010
_zrasyilla
040 _aUKM
090 _aQC39.D866 2010 3
090 _aQC39
_b.D866 2010 3
100 1 _aDunn, Patrick F.
245 1 0 _aMeasurement and data analysis for engineering and science /
_cPatrick F. Dunn
250 _a2nd ed.
260 _aBoca Raton, FL :
_bCRC Press,
_c2010
300 _axiii, 490 p. :
_bill. ;
_c25 cm.
504 _aIncludes bibliographical references and index
650 0 _aPhysical measurements
_vTextbooks
650 0 _aStatistics
_vTextbooks
907 _a.b14872560
_b2021-05-28
_c2019-11-12
942 _c01
_n0
_kQC39.D866 2010 3
914 _avtls003448842
990 _aza
991 _aFakulti Kejuruteraan dan Alam Bina (FKAB)
991 _aInstitut Kejuruteraan Mikro dan Nanoelektronik (IMEN)
998 _al
_at
_b2010-09-12
_cm
_da
_feng
_gflu
_y0
_z.b14872560
999 _c473839
_d473839