| 000 | 01161nam a2200337 a 4500 | ||
|---|---|---|---|
| 005 | 20250918122517.0 | ||
| 008 | 101012s2002 gw a b 001 0 eng | ||
| 020 | _a3540437649 (alk. paper) | ||
| 020 |
_a9783540437642 _cRM329.45 |
||
| 039 | 9 |
_a201010151145 _bzarina _c201010121213 _dfarid _y10-12-2010 _zfarid |
|
| 040 | _aUKM | ||
| 090 | _aTA417.23.F848 2002 3 | ||
| 090 |
_aTA417.23 _b.F848 2002 |
||
| 100 | 1 |
_aFultz, B. _q(Brent) |
|
| 245 | 1 | 0 |
_aTransmission electron microscopy and diffractometry of materials / _cBrent Fultz, James Howe |
| 250 | _a2nd ed. | ||
| 260 |
_aBerlin ; _aNew York : _bSpringer, _c2002 |
||
| 300 |
_axxi, 748 p. : _bill. ; _c24 cm. |
||
| 504 | _aIncludes bibliographical references and index | ||
| 650 | 0 |
_aMaterials _xMicroscopy |
|
| 650 | 0 | _aTransmission electron microscopy | |
| 650 | 0 | _aX-ray diffractometer | |
| 700 | 1 |
_aHowe, James M., _d1955- |
|
| 907 |
_a.b14813439 _b2021-05-28 _c2019-11-12 |
||
| 942 |
_c01 _n0 _kTA417.23.F848 2002 3 |
||
| 914 | _avtls003442625 | ||
| 990 | _aszj | ||
| 991 | _aPusat Pengajian Fizik Gunaan - QFG | ||
| 998 |
_al _b2010-12-10 _cm _da _feng _ggw _y0 _z.b14813439 |
||
| 999 |
_c468067 _d468067 |
||