| 000 | 01056nam a2200313 a 4500 | ||
|---|---|---|---|
| 005 | 20250913113959.0 | ||
| 008 | 981208s1976 xxua 00| 0 eng | ||
| 010 | _a76-016837 | ||
| 020 | _a0471611697 | ||
| 039 | 9 |
_a200801281800 _bshai _y08-18-1999 _zload |
|
| 090 | _aQD139.T7Z5 | ||
| 090 |
_aQD139 _b.T7Z5 |
||
| 245 | 0 | 0 |
_aContamination control in trace element analysis _c(by) Morris Zief (and) James W. Mitchell |
| 260 |
_aNew York : _bJohn Wiley & Sons, _c1976 |
||
| 300 |
_a262 p. : _bill. ; _c24 cm. |
||
| 440 |
_aChemical analysis _vv.47 |
||
| 500 | _a'A Wiley-Interscience publication' | ||
| 500 | _aIncludes bibliographical references and index | ||
| 650 | 0 |
_aTrace elements _xAnalysis |
|
| 650 | 0 | _aContamination (Technology) | |
| 700 | 1 | _aZief, Morris | |
| 907 |
_a.b10445134 _b2022-10-25 _c2019-11-12 |
||
| 942 |
_c01 _n0 _kQD139.T7Z5 |
||
| 914 | _avtls000046343 | ||
| 991 | _aFakulti Sains Fizik dan Gunaan | ||
| 991 | _aFakulti Sains dan Sumber Alam | ||
| 998 |
_at _b1999-05-08 _cm _da _feng _gxxu _y0 _z.b10445134 |
||
| 999 |
_c46470 _d46470 |
||