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_aMalacara, Daniel, _d1937- |
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_aInterferogram analysis for optical testing _h[electronic resource] / _cDaniel Malacara, Manuel Servn, Zacarias Malacara |
| 250 | _a2nd ed. | ||
| 260 |
_aBoca Raton, FL : _bTaylor & Francis, _c2005 |
||
| 490 | 1 |
_aOptical engineering ; _v84 |
|
| 500 | _aAccess to http://www.engnetbase.com/ejournals/search/advsearch1.asp3 and type in the title. You may access the full text after you type in the advanced search screen | ||
| 504 | _aIncludes bibliographical references and index | ||
| 650 | 0 | _aOptical measurements | |
| 650 | 0 | _aInterferometry | |
| 650 | 0 | _aInterferometers | |
| 650 | 0 |
_aDiffraction patterns _xData processing |
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| 700 | 1 | _aServn, Manuel | |
| 700 | 1 |
_aMalacara, Zacarias, _d1948- |
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| 830 | 0 |
_aOptical engineering (Marcel Dekker, Inc.) ; _vv. 84 |
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| 856 | 4 | 0 | _uhttps://eresourcesptsl.ukm.remotexs.co/login?url=http://www.engnetbase.com/ejournals/search/advsearch1.asp |
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_3CRCnetBASE _uhttp://www.engnetbase.com/ejournals/books/book_km.asp?id=2881 _zClick here for the electronic version |
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