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010 _a2005-050566
020 _a1574447203
035 _a13982392
039 9 _y07-03-2009
_zpuitm2
040 _aUKM
042 _apcc
082 0 0 _a621.3815/2/0286
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090 _aTK7871.85
_b.S5224 2005
100 1 _aSherer, J. Michael,
_d1958-
245 1 0 _aSemiconductor industry
_h[electronic resource] :
_bwafer fab exhaust management /
_cJ. Michael Sherer
246 3 0 _aWafer fab exhaust management
260 _aBoca Raton :
_bCRC/Taylor & Francis,
_c2005
500 _aAccess to 2http://www.engnetbase.com/ejournals/search/advsearch1.asp3 and type in the title. You may access the full text after you type in the advanced search screen
500 _aIncludes index
650 0 _aSemiconductor wafers
_xDesign and construction
650 0 _aSemiconductor industry
_xEnvironmental aspects
650 0 _aVolatile organic compounds
_xEnvironmental aspects
650 0 _aAir
_xPurification
_xTechnological innovations
856 4 0 _uhttps://eresourcesptsl.ukm.remotexs.co/login?url=://www.engnetbase.com/ejournals/search/advsearch1.asp
856 4 0 _3CRCnetBASE
_uhttp://www.engnetbase.com/ejournals/books/book_km.asp?id=4666
_zClick here for the electronic version
907 _a.b14532815
_b2022-04-06
_c2019-11-12
942 _n0
_kTK7871.85 .S5224 2005
914 _avtls003413093
906 _a7
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_z.b14532815
999 _c445506
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