000 01102cam a2200301 a 4500
005 20250918011703.0
008 090630s2008 njua bi 001 0 eng
020 _a9789812797339
_cRM 374.40
020 _a9812797335
039 9 _a200910221657
_blan
_c200910121641
_didah
_c200906301456
_drasyilla
_c200906301455
_drasyilla
_y06-30-2009
_zrasyilla
040 _aUKM
090 _aQH212.E4 I4155 3
090 _aQH212.E4
_bI4155
245 0 0 _aIn-situ electron microscopy at high resolution /
_ceditor, Florian Banhart
260 _aHackensack, New Jersey :
_bWorld Scientific,
_c2008
300 _avi, 311 p. :
_bill. (some col.) ;
_c24 cm.
504 _aIncludes bibliographical references and index
650 0 _aElectron microscopy
_xTechnique
650 0 _aHigh resolution electron microscopy
700 1 _aBanhart, Florian
907 _a.b14528277
_b2020-10-15
_c2019-11-12
942 _c01
_n0
_kQH212.E4 I4155 3
914 _avtls003412603
990 _arab
991 _aJabatan Kejuruteraan Mekanik dan Bahan
998 _al
_b2009-04-06
_cm
_da
_feng
_gnju
_y0
_z.b14528277
999 _c445056
_d445056