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| 008 | 090624s2009 flua sb 001 0 eng | ||
| 010 | _a2008-018722 | ||
| 020 | _a9781420043761 | ||
| 035 | _a(OCoLC)ocn226308170 | ||
| 035 |
_a(OCoLC)226308170 _z(OCoLC)144523104 |
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_y06-24-2009 _zpuitm2 |
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_aTK7871 _b.D44 2009 |
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_aDefects in microelectronic materials and devices _h[electronic resource] / _cedited by Daniel M. Fleetwood, Sokrates T. Pantelides, Ronald D. Schrimpf |
| 260 |
_aBoca Raton : _bCRC Press, _cc2009 |
||
| 500 | _aAccess to 2http://www.egnetbase.com/ejournals/search/advsearch1.asp' and type the title. You may access the full text after you type in title in the advanced search screen | ||
| 504 | _aIncludes bibliographical references and index | ||
| 650 | 0 |
_aMicroelectronics _xMaterials _xTesting |
|
| 650 | 0 |
_aMetal oxide semiconductor field-effect transistors _xTesting |
|
| 650 | 0 |
_aIntegrated circuits _xDefects |
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| 700 | 1 |
_aFleetwood, D. M. _q(Dan M.) |
|
| 700 | 1 | _aPantelides, Sokrates T. | |
| 700 | 1 | _aSchrimpf, Ronald Donald | |
| 856 | _uhttps://eresourcesptsl.ukm.remotexs.co/login?url=http://www.egnetbase.com/ejournals/search/advsearch1.asp | ||
| 856 | 4 | 0 |
_3CRCnetBASE _uhttp://www.engnetbase.com/ejournals/books/book_km.asp?id=7322 _zClick here for the electronic version |
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