000 01120nam a2200301 a 4500
005 20250918005501.0
008 090508s2007 enka b 001 0 eng d
020 _a9780521831994 (hbk.)
_cRM513.00
039 9 _a200908241611
_bzaina
_c200907281121
_dsanusi
_c200905081055
_didah
_y05-08-2009
_zidah
090 _aQC702.7.B65F636
090 _aQC702.7.B65
_bF636
245 0 0 _aFocused ion beam systems :
_bbasics and applications /
_cedited by Nan Yao
260 _aCambridge :
_bCambridge University Press,
_c2007
300 _axi, 395 p. :
_bill. ;
_c26 cm.
504 _aIncludes bibliographical references and index
650 0 _aFocused ion beams
650 0 _aFocused ion beams
_xIndustrial applications
650 0 _aIon bombardment
700 1 _aYao, Nan
856 _3Table of contents only
_uhttp://www.loc.gov/catdir/enhancements/fy0806/2007300349-t.html
907 _a.b14477919
_b2020-10-15
_c2019-11-12
942 _c01
_n0
_kQC702.7.B65F636
914 _avtls003407195
990 _azsz
991 _aProgram Sains Bahan
998 _at
_b2009-08-05
_cm
_da
_feng
_genk
_y0
_z.b14477919
999 _c440266
_d440266