000 01113nam a2200325 a 4500
005 20250918005501.0
008 090508s2008 enka b 001 0 eng
020 _a9780470027844 (hbk.) :
_cRM714.00
020 _a9780470027851 (hbk.)
039 9 _a200907131238
_bbedah
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_drasyilla
_c200905080935
_didah
_y05-08-2009
_zidah
040 _aUKM
090 _aTA417.23.B734 2008
090 _aTA417.23
_b.B734 2008
100 1 _aBrandon, D. G.
245 1 0 _aMicrostructural characterization of materials /
_cDavid Brandon and Wayne Kaplan
250 _a2nd ed.
260 _aChichester, England :
_bJohn Wiley & Sons,
_c2008
300 _axiv, 536 p. :
_bill. (some col.) ;
_c25 cm.
504 _aIncludes bibliographical references and index
650 0 _aMaterials
_xMicroscopy
650 0 _aMicrostructure
700 1 _aKaplan, Wayne D.
907 _a.b14477798
_b2020-10-15
_c2019-11-12
942 _c01
_n0
_kTA417.23.B734 2008
914 _avtls003407183
990 _aza
991 _aProgram Sains Bahan
998 _al
_b2009-08-05
_cm
_da
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_genk
_y0
_z.b14477798
999 _c440254
_d440254