| 000 | 00931nam a2200277 a 4500 | ||
|---|---|---|---|
| 005 | 20250913113807.0 | ||
| 008 | 981208s1973 ne 00 eng | ||
| 010 | _a72-93092 | ||
| 020 | _a0720417570 | ||
| 039 | 9 |
_a200711270941 _bbedah _y08-18-1999 _zload |
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| 090 | _aQD921.C64 | ||
| 090 |
_aQD921 _b.C64 |
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| 245 | 0 | 0 |
_aComputed electron micrographs and defect identification / _cA. K. Head ... [et al.] |
| 260 |
_aAmsterdam : _bNorth-Holland, _c1973 |
||
| 300 |
_ax, 400 ; _c23 cm. |
||
| 440 | 0 |
_aDefects in crystalline solids ; _vvol. 7 |
|
| 650 | 0 |
_aElectronic data processing _xMetals _xDefects |
|
| 650 | 0 |
_aElectronic data processing _xElectron microscopy |
|
| 700 | 1 | _aHead, A. K. | |
| 907 |
_a.b10419044 _b2021-05-28 _c2019-11-12 |
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| 942 |
_c01 _n0 _kQD921.C64 |
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| 914 | _avtls000043625 | ||
| 991 | _aFakulti Sains Fizik dan Gunaan | ||
| 998 |
_at _b1999-05-08 _cm _da _feng _gne _y0 _z.b10419044 |
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| 999 |
_c43865 _d43865 |
||