000			01763nam a22004455a 4500
005			20250930125144.0
006			m d
007			cr nn 008maaau
008			100622s2008 gw a j eng d
020			_a9783540738862 (electronic bk.)
020			_a9783540738855 (paper)
035			_a(Springer)978-3-540-73885-5
039		9	_a201006221419 _bmuhaimin _c201006171234 _dmuhaimin _c200902171852 _dmuhaimin _y02-04-2009 _zmuhaimin
050	0	0	_aTA417.23 _b.F85 2008
082	0	0	_a620.11299 _222
090			_aTA417.23 _b.F974 2008
100	1		_aFultz, Brent.
245	1	0	_aTransmission Electron Microscopy and Diffractometry of Materials _h[electronic resource] / _cby Brent Fultz, James M. Howe.
250			_aThird Edition.
260			_aBerlin, Heidelberg : _bSpringer-Verlag Berlin Heidelberg, _c2008.
300			_axix, 758 p. : _bill., digital ; _c24 cm.
650		0	_aMaterials _xMicroscopy.
650		0	_aTransmission electron microscopy.
650	1	4	_aChemistry. _959425
650	2	4	_aCharacterization and Evaluation of Materials.
650	2	4	_aCrystallography.
650	2	4	_aPhysics and Applied Physics in Engineering.
650	2	4	_aSolid State Physics and Spectroscopy.
650	2	4	_aSurfaces and Interfaces, Thin Films.
700	1		_aHowe, James M.
710	2		_aSpringerLink (Online service)
773	0		_tSpringer e-books
856	4	0	_uhttps://eresourcesptsl.ukm.remotexs.co/user/login?url=http://dx.doi.org/10.1007/978-3-540-73886-2
907			_a.b14389423 _b2024-11-20 _c2019-11-12
942			_n0 _kTA417.23 .F974 2008
914			_avtls003397890
998			_ae0001 _b2009-04-02 _cm _da _feng _ggw _y0 _z.b14389423
999			_c433687 _d433687