000			01652nam a22004335a 4500
005			20250918001935.0
006			m d
007			cr nn 008maaau
008			100623s2008 maua j eng d
020			_a9780387747477 (electronic bk.)
020			_a9780387747460 (paper)
035			_a(Springer)978-0-387-74746-0
039		9	_a201006231226 _bmuhaimin _c201006230928 _dmuhaimin _c200902041632 _dmuhaimin _y02-04-2009 _zmuhaimin
050	0	0	_aT174.7 _b.E44 2008
082	0	0	_a620.5 _222
090			_aT174.7 _b.E53 2008
245	0	0	_aEmerging Nanotechnologies _h[electronic resource] : _bTest, Defect Tolerance, and Reliability / _cedited by Mohammad Tehranipoor.
260			_aBoston, MA : _bSpringer Science+Business Media, LLC, _c2008.
300			_axii, 405 p. : _bill., digital ; _c24 cm.
440		0	_aFrontiers in Electronic Testing, _x0929-1296 ; _v37
650		0	_aNanotechnology.
650		0	_aMicrotechnology.
650	1	4	_aEngineering.
650	2	4	_aCircuits and Systems.
650	2	4	_aElectronic and Computer Engineering.
650	2	4	_aElectronics and Microelectronics, Instrumentation.
650	2	4	_aNanotechnology.
650	2	4	_aQuality Control, Reliability, Safety and Risk.
700	1		_aTehranipoor, Mohammad.
710	2		_aSpringerLink (Online service)
773	0		_tSpringer eBooks
856	4	0	_uhttp://dx.doi.org/10.1007/978-0-387-74747-7
907			_a.b14386677 _b2024-12-13 _c2019-11-12
942			_n0 _kT174.7 .E53 2008
914			_avtls003397601
998			_ae0001 _b2009-04-02 _cm _dz _feng _gmau _y0 _z.b14386677
999			_c433413 _d433413