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| 005 | 20250930125050.0 | ||
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| 007 | cr nn 008maaau | ||
| 008 | 100623s2008 ne q j eng d | ||
| 020 | _a9781402083631 (electronic bk.) | ||
| 020 | _a9781402083624 (paper) | ||
| 035 | _a(Springer)978-1-4020-8362-4 | ||
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_a201006230857 _bmuhaimin _y02-03-2009 _zmuhaimin |
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_aTK7874 _b.P337 2008 |
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_aPavlov, Andrei. _957470 |
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| 245 | 1 | 0 |
_aCMOS SRAM circuit design and parametric test in nano-scaled technologies _h[electronic resource] : _bprocess-aware SRAM design and test / _cby Andrei Pavlov, Manoj Sachdev. |
| 260 |
_aDordrecht : _bSpringer Science + Business Media B.V, _c2008. |
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| 300 |
_a212 p. : _bill., digital ; _c24 cm. |
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| 490 | 0 |
_aFrontiers in electronic testing ; _v40 |
|
| 650 | 0 |
_aMetal oxide semiconductors, Complementary _xDesign. |
|
| 650 | 0 | _aRandom access memory. | |
| 650 | 0 | _aNanoelectronics. | |
| 700 | 1 | _aSachdev, Manoj. | |
| 710 | 2 | _aSpringerLink (Online service) | |
| 773 | 0 | _tSpringer eBooks | |
| 856 | 4 | 0 | _uhttps://eresourcesptsl.ukm.remotexs.co/user/login?url=http://dx.doi.org/10.1007/978-1-4020-8363-1 |
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_n0 _kTK7874 .P337 2008 |
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