| 000 | 01180nam a2200325 a 4500 | ||
|---|---|---|---|
| 005 | 20250918000901.0 | ||
| 008 | 081202s2007 njua b 001 0 eng | ||
| 020 | _a0470081872 (hbk.) | ||
| 020 |
_a9780470081877 (hbk.) _cRM460.00 |
||
| 020 | _a0470096071 (pbk.) | ||
| 020 | _a9780470096079 (pbk.) | ||
| 039 | 9 |
_a201210011027 _byah _c200901050936 _dbedah _c200812020927 _drasyilla _y12-02-2008 _zrasyilla |
|
| 040 | _aUKM | ||
| 090 | _aTA340.R934 3 | ||
| 090 |
_aTA340 _b.R934 |
||
| 100 | 1 |
_aRyan, Thomas P., _d1945- |
|
| 245 | 1 | 0 |
_aModern engineering statistics / _cThomas P. Ryan |
| 260 |
_aHoboken, N. J. : _bJohn Wiley & Sons, _c2007 |
||
| 300 |
_axix, 586 p. : _bill. ; _c27 cm. |
||
| 504 | _aIncludes bibliographical references and indexes | ||
| 650 | 0 |
_aEngineering _xStatistical methods |
|
| 856 | 4 | 1 |
_3Table of contents only _uhttp://www.loc.gov/catdir/enhancements/fy0805/2006052158-t.html |
| 907 |
_a.b1431163x _b2020-10-15 _c2019-11-12 |
||
| 942 |
_c01 _n0 _kTA340.R934 3 |
||
| 914 | _avtls003389793 | ||
| 990 | _aza | ||
| 991 | _aInstitut Kejuruteraan dan Nanoelektronik - Pasca | ||
| 998 |
_al _b2008-02-12 _cm _da _feng _gnju _y0 _z.b1431163x |
||
| 999 |
_c426072 _d426072 |
||