| 000 | 01276nam a2200325 a 4500 | ||
|---|---|---|---|
| 005 | 20250914173644.0 | ||
| 008 | 080526s2008 njua b 001 0 eng | ||
| 020 |
_a9780132209106 (hbk.) _cRM300.00 |
||
| 020 | _a0132209101 (hbk.) | ||
| 039 | 9 |
_a200902031235 _bbedah _c200901150931 _drasyilla _c200805260943 _didah _y05-26-2008 _zidah |
|
| 040 | _aUKM | ||
| 090 | _aTK5103.7.D5325 | ||
| 090 |
_aTK5103.7 _b.D5325 |
||
| 245 | 0 | 0 |
_aDigital communications test and measurement : _bhigh-speed physical layer characterization / _cDennis Derickson and Marcus Muller, editors |
| 260 |
_aUpper Saddle River, NJ : _bPrentice Hall, _c2008 |
||
| 300 |
_axxxiii, 935 p. : _bill. ; _c25 cm. |
||
| 490 | 1 | _aPrentice Hall modern semiconductor design series | |
| 504 | _aIncludes bibliographical references and index | ||
| 650 | 0 |
_aDigital communications _xMeasurement |
|
| 700 | 1 | _aDerickson, Dennis | |
| 700 | 1 | _aMuller, Marcus | |
| 830 | 0 |
_aPrentice Hall modern semiconductor design series. _pPrentice Hall signal integrity library |
|
| 907 |
_a.b14200995 _b2020-10-15 _c2019-11-12 |
||
| 942 |
_c01 _n0 _kTK5103.7.D5325 |
||
| 914 | _avtls003377992 | ||
| 990 | _aza | ||
| 991 | _aJabatan Sains Makumat | ||
| 998 |
_al _b2008-01-05 _cm _da _feng _gnju _y0 _z.b14200995 |
||
| 999 |
_c415515 _d415515 |
||