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| 035 | _a(Springer)978-0-387-46546-3 | ||
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_aDefect-Oriented Testing for Nano-Metric CMOS VLSI Circuits _h[electronic resource] : _b2nd Edition / _cedited by Manoj Sachdev, Jose Pineda de Gyvez. |
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_aBoston, MA : _bSpringer, _c2007. |
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_a328 p. : _bill., digital ; _c24 cm. |
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_aFrontiers in Electronic Testing, _x0929-1296 ; _v34 |
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| 700 | 1 | _aSachdev, Manoj. | |
| 700 | 1 | _aGyvez, Jose Pineda de. | |
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