| 000 | 01308nam a22003255a 4500 | ||
|---|---|---|---|
| 005 | 20251204033123.0 | ||
| 006 | m q d | ||
| 007 | cr nn 008maaau | ||
| 008 | 090204s2007 gw q j eng d | ||
| 020 | _a9783540373193 (electronic bk.) | ||
| 035 | _a(Springer)978-3-540-37318-6 | ||
| 039 | 9 |
_a200902042119 _bmuhaimin _c200902042005 _dmuhaimin _c200804070806 _dmuhaimin _y04-07-2008 _zmuhaimin |
|
| 245 | 0 | 0 |
_aApplied Scanning Probe Methods VI : _bCharacterization _h[electronic resource] / _cedited by Bharat Bhushan, Satoshi Kawata. |
| 260 |
_aBerlin, Heidelberg : _bSpringer-Verlag Berlin Heidelberg, _c2007. |
||
| 300 |
_axli, 338 p. : _bill., digital ; _c24 cm. |
||
| 490 | 0 |
_aNanoScience and Technology, _x1434-4904 |
|
| 650 | 0 | _aScanning probe microscopy. | |
| 650 | 0 |
_aMaterials _xMicroscopy. |
|
| 700 | 1 | _aBhushan, Bharat. | |
| 700 | 1 | _aKawata, Satoshi. | |
| 710 | 2 | _aSpringerLink (Online service) | |
| 773 | 0 | _tSpringer e-books | |
| 856 | 4 | 0 | _uhttps://eresourcesptsl.ukm.remotexs.co/user/login?url=http://dx.doi.org/10.1007/11776314 |
| 907 |
_a.b14164280 _b2025-02-05 _c2019-11-12 |
||
| 914 | _avtls003374079 | ||
| 942 |
_n0 _2lcc |
||
| 998 |
_ae0001 _b2008-07-04 _cm _dz _feng _ggw |
||
| 999 |
_c412003 _d412003 |
||