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| 005 | 20250930124050.0 | ||
| 006 | m d | ||
| 007 | cr nn 008maaau | ||
| 008 | 090204s2007 nyu j eng d | ||
| 020 | _a9780387396200 (electronic bk.) | ||
| 035 | _a(Springer)978-0-387-33325-0 | ||
| 039 | 9 |
_a200902042119 _bmuhaimin _c200902042004 _dmuhaimin _c200804070805 _dmuhaimin _y04-07-2008 _zmuhaimin |
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| 082 | 0 | 4 |
_a570 _222 |
| 245 | 0 | 0 |
_aScanning Microscopy for Nanotechnology _h[electronic resource] : _bTechniques and Applications / _cedited by Weilie Zhou, Zhong Lin Wang. |
| 260 |
_aNew York, NY : _bSpringer Science+Business Media, LLC, _c2007. |
||
| 300 |
_axiv, 522 p., [12] p. of plates : _bill. (some col.), digital ; _c24 cm. |
||
| 650 | 0 | _aScanning electron microscopy. | |
| 650 | 0 | _aNanotechnology. | |
| 650 | 1 | 4 |
_aChemistry. _959425 |
| 650 | 2 | 4 | _aNanotechnology. |
| 650 | 2 | 4 | _aCharacterization and Evaluation of Materials. |
| 650 | 2 | 4 | _aOptical and Electronic Materials. |
| 650 | 2 | 4 | _aMeasurement Science, Instrumentation. |
| 700 | 1 | _aZhou, Weilie. | |
| 700 | 1 | _aWang, Zhong Lin. | |
| 710 | 2 | _aSpringerLink (Online service) | |
| 773 | 0 | _tSpringer e-books | |
| 856 | 4 | 0 | _uhttps://eresourcesptsl.ukm.remotexs.co/user/login?url=http://dx.doi.org/10.1007/978-0-387-39620-0 |
| 907 |
_a.b14164097 _b2024-12-12 _c2019-11-12 |
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| 914 | _avtls003374057 | ||
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_ae _b2008-07-04 _cm _dz _feng _gnyu _y0 _z.b14164097 |
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_c411984 _d411984 |
||