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007 cr nn 008maaau
008 090212s2006 gw q j eng d
020 _a9783540269106 (electronic bk.)
035 _a(Springer)978-3-540-26909-0
039 9 _a200902121847
_bmuhaimin
_y04-04-2008
_zmuhaimin
082 0 4 _a502.82
_222
245 0 0 _aApplied Scanning Probe Methods.
_nIII
_h[electronic resource] :
_bCharacterization /
_cedited by Bharat Bhushan, Harald Fuchs.
260 _aBerlin, Heidelberg :
_bSpringer-Verlag Berlin Heidelberg,
_c2006.
300 _axliii, 378 p. :
_bill., digital ;
_c24 cm.
490 0 _aNanoScience and Technology,
_x1434-4904
650 0 _aScanning probe microscopy.
650 0 _aScanning probe microscopy
_xIndustrial applications.
650 0 _aMaterials
_xMicroscopy.
650 1 4 _aChemistry.
_959425
650 2 4 _aNanotechnology.
650 2 4 _aSurfaces and Interfaces, Thin Films.
650 2 4 _aAnalytical Chemistry.
650 2 4 _aPhysical Chemistry.
650 2 4 _aPolymer Sciences.
650 2 4 _aSolid State Physics and Spectroscopy.
700 1 _aBhushan, Bharat.
700 1 _aFuchs, Harald.
710 2 _aSpringerLink (Online service)
773 0 _tSpringer e-books
856 4 0 _uhttps://eresourcesptsl.ukm.remotexs.co/user/login?url=http://dx.doi.org/10.1007/b138285
907 _a.b14149199
_b2024-03-19
_c2019-11-12
942 _n0
914 _avtls003372501
998 _ae0001
_b2008-04-04
_cm
_dz
_feng
_ggw
_y0
_z.b14149199
999 _c410899
_d410899