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| 008 | 090212s2006 nyu q j eng d | ||
| 020 | _a9780387372310 (electronic bk.) | ||
| 035 | _a(Springer)978-0-387-40090-7 | ||
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| 100 | 1 | _aFoster, Adam. | |
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_aScanning Probe Microscopy _h[electronic resource] : _bAtomic Scale Engineering by Forces and Currents / _cby Adam Foster, Werner Hofer. |
| 260 |
_aNew York, NY : _bSpringer Science+Business Media, LLC, _c2006. |
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_axiv, 281 pages : _billustration, digital ; _c25 cm. |
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_aNanoScience and Technology, _x1434-4904 |
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| 650 | 0 | _aScanning probe microscopy. | |
| 700 | 1 | _aHofer, Werner. | |
| 710 | 2 | _aSpringerLink (Online service) | |
| 773 | 0 | _tSpringer e-books | |
| 856 | 4 | 0 | _uhttps://eresourcesptsl.ukm.remotexs.co/user/login?url=http://dx.doi.org/10.1007/0-387-37231-8 |
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