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005			20250914164812.0
006			m d
007			cr nn 008maaau
008			090212s2006 gw q j eng d
020			_a9783540279860 (electronic bk.)
020			_a9783540279853 (paper)
035			_a(Springer)978-3-540-27985-3
039		9	_a200902121752 _bmuhaimin _c200902121014 _dmuhaimin _c200804041000 _dmuhaimin _c200804040927 _dmuhaimin _y04-03-2008 _zmuhaimin
050	0	0	_aQD945 _b.W45 2006
082	0	0	_a548.83 _222
090			_aQD945 _b.W689 2006
100	1		_aWill., Georg.
245	1	0	_aPowder Diffraction _h[electronic resource] : _bThe Rietveld Method and the Two Stage Method to Determine and Refine Crystal Structures from Powder Diffraction Data / _cby Georg Will.
260			_aBerlin, Heidelberg : _bSpringer-Verlag Berlin Heidelberg, _c2006.
300			_aix, 224 p. : _bill., digital ; _c25 cm.
650		0	_aRietveld method.
650		0	_aX-rays _xDiffraction.
710	2		_aSpringerLink (Online service)
773	0		_tSpringer e-books
856	4	0	_uhttps://eresourcesptsl.ukm.remotexs.co/user/login?url=http://dx.doi.org/http://dx.doi.org/10.1007/3-540-27986-5
907			_a.b14130543 _b2025-04-25 _c2019-11-12
942			_n0 _kQD945 .W689 2006
914			_avtls003370550
998			_ae _b2008-03-04 _cm _dz _feng _ggw _y0 _z.b14130543
999			_c409034 _d409034