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| 005 | 20250914164749.0 | ||
| 006 | m d | ||
| 007 | cr nn 008maaau | ||
| 008 | 090217s2005 gw j eng d | ||
| 020 | _a9783540279228 (electronic bk.) | ||
| 020 | _a9783540253037 (paper) | ||
| 035 | _a(Springer)978-3-540-25303-7 | ||
| 039 | 9 |
_a200902171225 _bmuhaimin _c200902021321 _dmuhaimin _c200809161728 _dmuhaimin _c200804031231 _dmuhaimin _y04-03-2008 _zmuhaimin |
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_aTK7871.15.S55 _bR45 2005 |
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_aTK7871.15.S55 _bR364 2005 |
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| 100 | 1 | _aRein, Stefan. | |
| 245 | 1 | 0 |
_aLifetime Spectroscopy _h[electronic resource] : _bA Method of Defect Characterization in Silicon for Photovoltaic Applications / _cby Stefan Rein. |
| 260 |
_aBerlin, Heidelberg : _bSpringer-Verlag Berlin Heidelberg, _c2005. |
||
| 300 |
_axxvi, 489 p. : _bill., digital ; _c25 cm. |
||
| 440 | 0 |
_aSpringer Series in Material Science, _x0933-033X ; _v85 |
|
| 650 | 0 |
_aSilicon crystals _xDefects. |
|
| 650 | 0 |
_aSilicon crystals _xSpectra. |
|
| 650 | 1 | 4 | _aPhysics. |
| 650 | 2 | 4 | _aOptical and Electronic Materials. |
| 650 | 2 | 4 | _aSolid State Physics and Spectroscopy. |
| 710 | 2 | _aSpringerLink (Online service) | |
| 773 | 0 | _tSpringer e-books | |
| 856 | 4 | 0 | _uhttps://eresourcesptsl.ukm.remotexs.co/login?url=http://dx.doi.org/10.1007/3-540-27922-9 |
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_a.b14121463 _b2022-04-06 _c2019-11-12 |
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_n0 _kTK7871.15.S55 R364 2005 |
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_ae _b2008-03-04 _cm _dz _feng _ggw _y0 _z.b14121463 |
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