000			01641nam a22004095a 4500
005			20250914164744.0
006			m d
007			cr nn 008maaau
008			090217s2005 mau j eng d
020			_a9780387233130 (electronic bk.)
020			_a9780387231167 (paper)
035			_a(Springer)978-0-387-23116-7
039		9	_a200902171223 _bmuhaimin _c200902021319 _dmuhaimin _c200809161725 _dmuhaimin _c200804031229 _dmuhaimin _y04-03-2008 _zmuhaimin
050	0	0	_aQC702.7.B65 _bI63 2005
082	0	0	_a621.38152 _222
090			_aQC702.7.B65 _bI61 2005
245	0	0	_aIntroduction to Focused Ion Beams _h[electronic resource] : _bInstrumentation, Theory, Techniques and Practice / _cedited by Lucille A. Giannuzzi, Fred A. Stevie.
260			_aBoston, MA : _bSpringer Science+Business Media, Inc., _c2005.
300			_axiv, 357 p. : _bill., digital ; _c25 cm.
650		0	_aFocused ion beams.
650	1	4	_aPhysics.
650	2	4	_aOptical and Electronic Materials.
650	2	4	_aSurfaces and Interfaces, Thin Films.
650	2	4	_aCondensed Matter.
650	2	4	_aSolid State Physics and Spectroscopy.
700	1		_aGiannuzzi, Lucille A.
700	1		_aStevie, Fred A.
710	2		_aSpringerLink (Online service)
773	0		_tSpringer e-books
856	4	0	_uhttps://eresourcesptsl.ukm.remotexs.co/login?url=http://dx.doi.org/10.1007/b101190
907			_a.b14120021 _b2022-04-06 _c2019-11-12
942			_n0 _kQC702.7.B65 I61 2005
914			_avtls003369444
998			_ae _b2008-03-04 _cm _dz _feng _gmau _y0 _z.b14120021
999			_c407983 _d407983