| 000 | 01927nam a22004695a 4500 | ||
|---|---|---|---|
| 005 | 20250930123707.0 | ||
| 006 | m d | ||
| 007 | cr nn 008maaau | ||
| 008 | 090217s2005 gw j eng d | ||
| 020 | _a9783540319153 (electronic bk.) | ||
| 020 | _a9783540319146 (paper) | ||
| 035 | _a(Springer)978-3-540-31914-6 | ||
| 039 | 9 |
_a200902171845 _bmuhaimin _y04-03-2008 _zmuhaimin |
|
| 050 | 0 | 0 |
_aQC611.6.S9 _bM554 2005 |
| 082 | 0 | 0 |
_a621.38152 _222 |
| 090 |
_aQC611.6.S9 _bM626 2005 |
||
| 245 | 0 | 0 |
_aMicroscopy of Semiconducting Materials _h[electronic resource] : _bProceedings of the 14th Conference, April 11-14, 2005, Oxford, UK / _cedited by A. G. Cullis, J. L. Hutchison. |
| 260 |
_aBerlin, Heidelberg : _bSpringer-Verlag Berlin Heidelberg, _c2005. |
||
| 300 |
_axvi, 537 p. : _bill., digital ; _c24 cm. |
||
| 440 | 0 |
_aSpringer Proceedings in Physics, _x0930-8989 ; _v107 |
|
| 650 | 0 |
_aSemiconductors _xSurfaces _vCongresses. |
|
| 650 | 0 |
_aSemiconductors _xCharacterization _vCongresses. |
|
| 650 | 0 |
_aMaterials _xMicroscopy _vCongresses. |
|
| 650 | 0 |
_aEpitaxy _vCongresses. |
|
| 650 | 0 |
_aHigh resolution electron microscopy _vCongresses. |
|
| 650 | 1 | 4 |
_aChemistry. _959425 |
| 650 | 2 | 4 | _aMaterials Science. |
| 650 | 2 | 4 | _aElectronics and Microelectronics, Instrumentation. |
| 650 | 2 | 4 | _aSolid State Physics and Spectroscopy. |
| 650 | 2 | 4 | _aMeasurement Science, Instrumentation. |
| 700 | 1 | _aCullis, A. G.. | |
| 700 | 1 | _aHutchison, J. L.. | |
| 710 | 2 | _aSpringerLink (Online service) | |
| 773 | 0 | _tSpringer e-books | |
| 856 | 4 | 0 | _uhttps://eresourcesptsl.ukm.remotexs.co/login?url=http://dx.doi.org/10.1007/3-540-31915-8 |
| 907 |
_a.b14102821 _b2022-04-06 _c2019-11-12 |
||
| 942 |
_n0 _kQC611.6.S9 M626 2005 |
||
| 914 | _avtls003367653 | ||
| 998 |
_ae _b2008-03-04 _cm _dz _feng _ggw _y0 _z.b14102821 |
||
| 999 |
_c406266 _d406266 |
||