000 01509cam a2200349 a 4500
005 20250914162838.0
008 071227s2007 njua b 001 0 eng
020 _a047179371X (cloth : acid-free paper)
_cRM280.34
020 _a9780471793717 (cloth : acid-free paper)
039 9 _a200803191239
_blan
_c200803191107
_dlan
_c200803071415
_drahah
_c200712271552
_drahah
_y12-27-2007
_zrahah
040 _aUKM
090 _aQA76.76.T48E94
090 _aQA76.76.T48
_bE94
100 1 _aEverett, Gerald D.,
_d1943-
245 1 0 _aSoftware testing :
_btesting across the entire software development life cycle /
_cGerald D. Everett, Raymond McLeod, Jr.
260 _aHoboken, New Jersey :
_bJohn Wiley & Sons, Inc,
_c2007
300 _axv, 261 p. :
_bill. ;
_c25 cm.
504 _aIncludes bibliographical references and index
650 0 _aComputer software
_xTesting
650 0 _aComputer software
_xDevelopment
700 1 _aMcleod, Raymond
856 4 1 _3Table of contents only
_uhttp://www.loc.gov/catdir/toc/ecip078/2007001282.html
856 4 2 _3Contributor biographical information
_uhttp://www.loc.gov/catdir/enhancements/fy0739/2007001282-b.html
856 4 2 _3Publisher description
_uhttp://www.loc.gov/catdir/enhancements/fy0739/2007001282-d.html
907 _a.b14039163
_b2021-05-28
_c2019-11-12
942 _c01
_n0
_kQA76.76.T48E94
914 _avtls003361047
990 _arab
991 _aJabatan Sains Komputer
998 _at
_b2007-01-12
_cm
_da
_feng
_gnju
_y0
_z.b14039163
999 _c400102
_d400102