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005 20250930123324.0
008 071030s2007 nyua bi 001 0 eng c
020 _a9780387292601 (hbk.)
020 _a0387292608 (hbk.)
_cRM342.06
020 _a0387292616 (e-book)
020 _a9780387292618 (e-book)
039 9 _a200807081522
_bruzini
_c200805081050
_dariff
_c200804101410
_drahah
_c200804101408
_drahah
_y10-30-2007
_zrahah
040 _aUKM
090 _aQC176.83.A445
090 _aQC176.83
_b.A445
100 1 _aAlford, Terry L.
245 1 0 _aFundamentals of nanoscale film analysis /
_cTerry L. Alford, Leonard C. Feldman and James W. Mayer
260 _aNew York, N.Y. :
_bSpringer,
_c2007
300 _axiv, 336 p. :
_bill. ;
_c25 cm.
504 _aIncludes bibliographical references and index
650 0 _aThin films
650 0 _aNanostructured materials
_963530
700 1 _aFeldman, Leonard C.
700 1 _aMayer, James W.,
_d1930-
856 4 1 _3Table of contents only
_uhttp://www.loc.gov/catdir/toc/fy0713/2005933265.html
907 _a.b14023374
_b2021-05-28
_c2019-11-12
942 _c01
_n0
_kQC176.83.A445
914 _avtls003359345
990 _amaa
991 _aProgram Sains Nuklear - QFN
991 _aJabatan Bioperubatan, KKL
998 _ad
_at
_b2007-04-10
_cm
_da
_feng
_gnyu
_y0
_z.b14023374
999 _c398599
_d398599