| 000 | 01370nam a2200337 a 4500 | ||
|---|---|---|---|
| 005 | 20250914160501.0 | ||
| 008 | 070423s2007 maua b 001 0 eng | ||
| 020 |
_a0072966629 (hbk.) _cRM541.86 |
||
| 039 | 9 |
_a200707061703 _bbedah _c200707061653 _dbedah _c200706191230 _drasyilla _c200704231609 _y04-23-2007 _zrahah |
|
| 090 | _aTS156.G797 2007 pasca | ||
| 090 |
_aTS156 _b.G797 2007 |
||
| 100 | 1 | _aGryna, Frank M. | |
| 245 | 1 | 0 |
_aJuran's quality planning and analysis : _bfor enterprise quality / _cFrank M. Gryna, Richard C. H. Chua, Joseph A. DeFeo |
| 246 | 3 | 0 | _aQuality planning and analysis |
| 250 | _a5th ed. | ||
| 260 |
_aBoston : _bMcGraw-Hill/Higher Education, _c2007 |
||
| 300 |
_axxvi, 774 p. : _bill. ; _c24 cm. |
||
| 440 | 0 | _aMcGraw-Hill series in industrial engineering and management science | |
| 504 | _aIncludes bibliographical references and indexes | ||
| 650 | 0 | _aQuality control | |
| 700 | 1 | _aChua, Richard Chim Hai | |
| 700 | 1 | _aDe Feo, Joseph A. | |
| 856 | 4 | 1 |
_3Table of contents only _uhttp://www.loc.gov/catdir/enhancements/fy0664/2005029517-t.html |
| 907 |
_a.b13908765 _b2021-05-28 _c2019-11-12 |
||
| 942 |
_c01 _n0 _kTS156.G797 2007 pasca |
||
| 914 | _avtls003346819 | ||
| 990 | _aza | ||
| 991 | _aProgram Kejuruteraan Mikro dan Nanoelektronik - Pasca | ||
| 998 |
_al _b2007-10-04 _cm _da _feng _gmau _y0 _z.b13908765 |
||
| 999 |
_c387822 _d387822 |
||