| 000 | 01172nam a2200325 a 4500 | ||
|---|---|---|---|
| 005 | 20250914155512.0 | ||
| 008 | 070406s2006 njua b 001 0 eng | ||
| 020 |
_a0471739065 (acid-free paper) _cRM460.02 |
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| 020 | _a9780471739067 | ||
| 039 | 9 |
_a201311251754 _bzaina _c200704101446 _djamil _c200704061557 _didah _y04-06-2007 _zidah |
|
| 090 | _aQC611.S373 2006 | ||
| 090 |
_aQC611 _b.S373 2006 |
||
| 100 | 1 | _aSchroder, Dieter K. | |
| 245 | 1 | 0 |
_aSemiconductor material and device characterization / _cDieter K. Schroder. |
| 250 | _a3rd ed. | ||
| 260 |
_a[Piscataway, NJ] : _bIEEE Press, _c2006. |
||
| 300 |
_axv, 779 p. : _bill. ; _c25 cm. |
||
| 500 | _aWiley-Interscience. | ||
| 504 | _aIncludes bibliographical references and index. | ||
| 650 | 0 | _aSemiconductors. | |
| 650 | 0 |
_aSemiconductors _xTesting. |
|
| 856 | 4 | 1 |
_3Table of contents only _uhttp://www.loc.gov/catdir/enhancements/fy0645/2005048514-t.html |
| 907 |
_a.b13895151 _b2021-05-28 _c2019-11-12 |
||
| 942 |
_c01 _n0 _kQC611.S373 2006 |
||
| 914 | _avtls003345358 | ||
| 990 | _ajj | ||
| 991 | _aInstitut Sains Angkasa | ||
| 998 |
_at _b2007-06-04 _cm _da _feng _gnju _y0 _z.b13895151 |
||
| 999 |
_c386533 _d386533 |
||