| 000 | 01168nam a2200313 a 4500 | ||
|---|---|---|---|
| 005 | 20250930122613.0 | ||
| 008 | 070327s2006 gw a bi 001 0 eng | ||
| 020 |
_a3540284052 (hbk.) _cRM433.56 |
||
| 024 | 3 | _a9783540284055 (hbk.) | |
| 039 | 9 |
_a201312261813 _blan _c200803271235 _dzarina _c200803131449 _dmazarita _y03-27-2007 _zfarid |
|
| 040 | _dUKM | ||
| 090 | _aQH212.A78K386 | ||
| 090 |
_aQH212.A78 _bK386 |
||
| 100 | 1 |
_aKaupp, G. _q(Gerd). _956368 |
|
| 245 | 1 | 0 |
_aAtomic force microscopy, scanning nearfield optical microscopy and nanoscratching : _bapplication to rough and natural surfaces / _cG. Kaupp. |
| 260 |
_aBerlin : _bSpringer-Verlag, _c2006. |
||
| 300 |
_axii, 292 p. : _bill. ; _c24 cm. |
||
| 440 | 0 | _aNanoscience and technology. | |
| 504 | _aIncludes bibliographical references and index. | ||
| 650 | 0 | _aAtomic force microscopy. | |
| 650 | 0 | _aNear-field microscopy. | |
| 907 |
_a.b13887749 _b2021-05-28 _c2019-11-12 |
||
| 942 |
_c01 _n0 _kQH212.A78K386 |
||
| 914 | _avtls003344571 | ||
| 990 | _aszj | ||
| 991 | _aInstitut Kejuruteraan Mikro & Nanoelektrik (IMEN) | ||
| 998 |
_at _b2007-01-03 _cm _da _feng _ggw _y0 _z.b13887749 |
||
| 999 |
_c385908 _d385908 |
||