000 01235cam a22003254a 4500
005 20250914155249.0
008 070212s2005 nyua b 001 0ceng
020 _a0831132035 (professional/textbook : alk. paper)
_cRM156.87
039 9 _a200704191510
_bjamil
_c200704181230
_didah
_c200702121125
_drahah
_y02-12-2007
_zrahah
090 _aHD47.3.S38 3
090 _aHD47.3
_b.S38
100 1 _aSato, Yoshihiko
245 1 0 _aValue analysis tear-down :
_ba new process for product development and innovation /
_cYoshihiko Sato and J. Jerry Kaufman
260 _aNew York :
_bIndustrial Press,
_c2005
300 _ax, 206 p. :
_bill. ;
_c24 cm.
504 _aIncludes bibliographical references (p. 199) and index
650 0 _aValue analysis (Cost control)
650 0 _aIndustrial productivity
650 0 _aNew products
650 0 _aEngineering economy
700 1 _aKaufman, J. Jerry
856 4 1 _3Table of contents
_uhttp://www.loc.gov/catdir/toc/ecip0422/2004019919.html
907 _a.b13862376
_b2021-05-28
_c2019-11-12
942 _c01
_n0
_kHD47.3.S38 3
914 _avtls003341824
990 _ajj
991 _aProgram Sains Maklumat
998 _al
_b2007-12-02
_cm
_da
_feng
_gnyu
_y0
_z.b13862376
999 _c383577
_d383577