| 000 | 01145cam a22003134a 4500 | ||
|---|---|---|---|
| 005 | 20250914155153.0 | ||
| 008 | 070122s2001 enka b 001 0 eng | ||
| 020 |
_a0748409688 (pbk.) _cRM210.80 |
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| 039 | 9 |
_a200706221023 _bjamil _c200706190852 _didah _c200701221629 _drahah _y01-22-2007 _zrahah |
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| 090 | _aQH212.E4G66 2001 | ||
| 090 |
_aQH212.E4 _bG66 2001 |
||
| 100 | 1 | _aGoodhew, Peter J. | |
| 245 | 1 | 0 |
_aElectron microscopy and analysis / _cPeter J. Goodhew, John Humphreys, Richard Beanland |
| 250 | _a3rd ed. | ||
| 260 |
_aLondon : _bTaylor & Francis, _c2001 |
||
| 300 |
_ax, 251 p. : _bill. ; _c24 cm. |
||
| 504 | _aIncludes bibliographical references (p. [236]-237) and index | ||
| 650 | 0 | _aElectron microscopy | |
| 700 | 1 | _aHumphreys, F. J. | |
| 700 | 1 | _aBeanland, R. | |
| 856 | 4 | 2 |
_3Publisher description _uhttp://www.loc.gov/catdir/enhancements/fy0652/00037716-d.html |
| 907 |
_a.b13849554 _b2021-05-28 _c2019-11-12 |
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| 942 |
_c01 _n0 _kQH212.E4G66 2001 |
||
| 914 | _avtls003340382 | ||
| 990 | _ajj | ||
| 991 | _aFakulti Sains dan Teknologi | ||
| 998 |
_at _b2007-09-01 _cm _da _feng _genk _y0 _z.b13849554 |
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| 999 |
_c382441 _d382441 |
||