| 000 | 01391nam a2200361 a 4500 | ||
|---|---|---|---|
| 005 | 20250930122338.0 | ||
| 007 | hd ufu baaa | ||
| 008 | 061218s2002 my a am 000 0 may | ||
| 039 | 9 |
_a200804201652 _bnordin _y12-18-2006 _znordin |
|
| 040 |
_aUKM _erda |
||
| 043 | _aa-my--- | ||
| 090 | _amikrofilem tesis TK7871.99.M44F335 2006 | ||
| 090 |
_amikrofilem tesis TK7871.99.M44 _bF335 2006 |
||
| 100 | 0 |
_aFahmi Samsuri _eauthor. |
|
| 245 | 1 | 0 |
_aReka bentuk litar pengesan arus bagi pengujian logik dan iddq secara serentak / _cFahmi bin Samsuri |
| 264 | 1 |
_aBangi : _bPerpustakaan Tun Seri Lanang, _c2006 |
|
| 300 |
_a1 microfilm reel ; _c35 mm. |
||
| 336 |
_atext _2rdacontent |
||
| 337 |
_amicroform _2rdamedia |
||
| 338 |
_amicrofilm _2rdacarrier |
||
| 502 | _aTesis (Sarjana Sains) - Universiti Kebangsaan Malaysia, 2002 | ||
| 610 | 2 | 0 |
_aUniversiti Kebangsaan Malaysia _xDissertations _962865 |
| 650 | 0 | _aIddq testing. | |
| 650 | 0 |
_aMetal oxide semiconductorss, Complemantary _xTesting. |
|
| 650 | 0 |
_aIntegrated circuits _xVery large scale integration _xTesting. |
|
| 650 | 0 |
_aDissertations, Academic _zMalaysia. _962866 |
|
| 907 |
_a.b13838052 _b2022-05-23 _c2019-11-12 |
||
| 942 |
_c3 _n0 _kmikrofilem tesis TK7871.99.M44F335 2006 |
||
| 914 | _avtls003339118 | ||
| 990 | _anordin | ||
| 991 | _aKoleksi Arkib | ||
| 998 |
_at _b2006-05-12 _cm _dy _fmay _gmy _y0 _z.b13838052 |
||
| 999 |
_c381445 _d381445 |
||