| 000 | 01252cam a22003377a 4500 | ||
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| 005 | 20250914143516.0 | ||
| 008 | 060316s2005 si a b 001 0 eng | ||
| 010 | _a2006-273468 | ||
| 020 |
_a9812563954 _cRM281.20 |
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| 039 | 9 |
_a200607171422 _bjamil _c200607171415 _djamil _c200607071153 _drahah _c200607071152 _y05-22-2006 _zzakir |
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| 090 | _aTK7871.85.L486 3 | ||
| 090 |
_aTK7871.85 _b.L486 |
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| 100 | 1 |
_aLevinshte✹, M. E. _q(Mikhail Efimovich) |
|
| 245 | 1 | 0 |
_aBreakdown phenomena in semiconductors and semiconductor devices / _cMichael Levinshtein, Juha Kostamovaara, Sergey Vainshtein |
| 260 |
_aSingapore : _bWorld Scientific, _c2005 |
||
| 300 |
_axiii, 208 p. : _bill. ; _c26 cm. |
||
| 440 | 0 |
_aSelected topics in electronics and systems ; _vv. 36 |
|
| 504 | _aIncludes bibliographical references and indexes | ||
| 650 | 0 | _aSemiconductors | |
| 650 | 0 | _aBreakdown (Electricity) | |
| 650 | 0 | _aHigh voltages | |
| 700 | 1 | _aKostamovaara, Juha | |
| 700 | 1 | _aVainshtein, Sergey | |
| 907 |
_a.b13734726 _b2021-05-28 _c2019-11-12 |
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| 942 |
_c01 _n0 _kTK7871.85.L486 3 |
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| 914 | _avtls003327763 | ||
| 990 | _ajj | ||
| 991 | _aInstitut Sains Angkasa - Pasca | ||
| 998 |
_al _b2006-09-05 _cm _da _feng _gsi _y0 _z.b13734726 |
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| 999 |
_c371879 _d371879 |
||