| 000 | 01375cam a22003254a 4500 | ||
|---|---|---|---|
| 005 | 20250914140525.0 | ||
| 008 | 031015s2004 njua bi 001 0 eng | ||
| 020 |
_a047143308X (cloth) _cRM294.32 |
||
| 039 | 9 |
_a200510181030 _bariff _c200509060928 _didah _c200507121125 _didah _y07-12-2005 _zidah |
|
| 090 | _aTK7867.2.M665 3 | ||
| 090 | _aTK7867.2 | ||
| 100 | 1 | _aMontrose, Mark I. | |
| 245 | 1 | 0 |
_aTesting for EMC compliance : _bapproaches and techniques / _cMark I. Montrose, Edward M. Nakauchi |
| 260 |
_aHoboken, NJ : _bJohn Wiley, _c2004 |
||
| 300 |
_axviii, 460 p. : _bill. ; _c24 cm. |
||
| 504 | _aIncludes bibliographical references (p. 447-451) and index | ||
| 650 | 0 | _aElectromagnetic compatibility | |
| 650 | 0 | _aElectromagnetic interference | |
| 700 | 1 | _aNakauchi, Edward M. | |
| 856 | 4 | 2 |
_3Contributor biographical information _uhttp://www.loc.gov/catdir/bios/wiley046/2003063488.html |
| 856 | 4 | 2 |
_3Publisher description _uhttp://www.loc.gov/catdir/description/wiley041/2003063488.html |
| 856 | 4 | 1 |
_3Table of contents _uhttp://www.loc.gov/catdir/toc/wiley041/2003063488.html |
| 907 |
_a.b13554578 _b2020-10-15 _c2019-11-12 |
||
| 942 |
_c01 _n0 _kTK7867.2.M665 3 |
||
| 914 | _avtls003308355 | ||
| 990 | _amaa | ||
| 991 | _aJabatan Kejuruteraan Elektrik, Elektronik & Sistem | ||
| 998 |
_anone _b2005-12-07 _cm _da _feng _gnju _y0 _z.b13554578 |
||
| 999 |
_c354629 _d354629 |
||