000			01373cam a22003014a 4500
005			20250914140340.0
008			050525s2005 xxua g b 001 0 eng
020			_a1580539459 (alk. paper) _cRM428.04
039		9	_a200508181115 _bjamil _c200507181047 _dzakir _y05-25-2005 _zzakir
090			_aTK7878.4.N39 3
090		0	_aTK7878.4
100	1		_aNawrocki, Waldemar
245	1	0	_aMeasurement systems and sensors / _cWaldemar Nawrocki
260			_aBoston, Mass. : _bArtech House, _c2005
300			_axi, 325 p. : _bill. ; _c24 cm.
504			_aIncludes bibliographical references and index
505	0		_aComputer-based measurement systems -- Temperature sensors -- Stress and pressure sensors -- Signal conditioners -- Digital-to-analog and analog-to-digital converters -- Measurement systems with serial interface -- Wireless measurement systems -- Measurement systems with IEEE-488 interface -- Crate and modular measurement systems -- LAN-based measurement systems -- DAQ boards and virtual instruments.
650		0	_aElectronic instruments
650		0	_aMensuration
650		0	_aDetectors
907			_a.b13532856 _b2021-05-28 _c2019-11-12
942			_c01 _n0 _kTK7878.4.N39 3
914			_avtls003305818
990			_ajj
991			_aInstitut Sains Angkasa - Pascasiswazah
998			_al _b2005-12-05 _cm _da _feng _gxxu _y0 _z.b13532856
999			_c352474 _d352474