| 000 | 01028nam a22002775a 4500 | ||
|---|---|---|---|
| 005 | 20250914135648.0 | ||
| 008 | 050315s2004 xxua b 000 0 eng | | ||
| 020 |
_a3540224521 (hb) _cRM371.43 |
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| 039 | 9 |
_a201207261620 _byah _c201102111126 _dlan _c200608171228 _djamil _c200607250949 _didah _y03-15-2005 _zidah |
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| 090 | _aT174.7.N3665 | ||
| 090 |
_aT174.7 _b.N3665 |
||
| 245 | 0 | 0 |
_aNanotechnology and nanoelectronics : _bmaterials, devices, measurement techniques / _cW. R. Fahrner (editor) |
| 260 |
_aNew York, NY : _bSpringer-Verlag, _c2005 |
||
| 300 |
_axvi, 269 p. : _bill. ; 24 cm. |
||
| 504 | _aReferences : p. [239]-260 | ||
| 650 | 0 | _aNanotechnology | |
| 700 | 1 |
_aFahrner, W. R. _q(Wolfgong R.) |
|
| 907 |
_a.b13494120 _b2022-02-28 _c2019-11-12 |
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| 942 |
_c6 _n0 _kT174.7.N3665 |
||
| 914 | _avtls003301691 | ||
| 990 | _ahe/nms | ||
| 991 | _aInstitut Kejuruteraan Mikro & Nanoelektronik | ||
| 991 | _aInstitut Sains Angkasa - Pasca | ||
| 998 |
_al _at _b2005-02-03 _cm _da _feng _gxxu _y0 _z.b13494120 |
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| 999 |
_c348628 _d348628 |
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