| 000 | 01091nam a2200289 a 4500 | ||
|---|---|---|---|
| 005 | 20250914135101.0 | ||
| 008 | 041228s2004 xxua b 001 eng | ||
| 020 | _a0471697362 | ||
| 039 | 9 |
_a200810111614 _bhayat _c200810111610 _dhayat _y12-28-2004 _zzakir |
|
| 090 | _aQA276 | ||
| 100 | 1 |
_aNelson, Wayne, _d1936- |
|
| 245 | 1 | 0 |
_aAccelerated testing : _bstatistical models, test plans, and data analyses / _cWayne Nelson |
| 250 | _a2nd ed. | ||
| 260 |
_aNew York : _bJohn Wiley & Sons, _c2004 |
||
| 440 | 0 | _aWiley series in probability and mathematical statistics. Applied probability and statistics | |
| 500 | _a'A Wiley-Interscience publication' | ||
| 504 | _aIncludes bibliographical references | ||
| 650 | 0 | _aFailure time data analysis | |
| 650 | 0 |
_aReliability (Engineering) _xStatistical methods |
|
| 650 | 0 |
_aAccelerated life testing _xStatistical methods |
|
| 907 |
_a.b13464681 _b2021-05-28 _c2019-11-12 |
||
| 942 |
_n0 _kQA276 |
||
| 914 | _avtls003298456 | ||
| 991 | _aProgram Matematik | ||
| 998 |
_anone _b2004-02-12 _cm _da _feng _gxxu _y0 _z.b13464681 |
||
| 999 |
_c345703 _d345703 |
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