| 000 | 01007nam a2200265 a 4500 | ||
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| 005 | 20250913112407.0 | ||
| 008 | 981208s1991 miu m 000 0 eng | ||
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_a200704181225 _bfati _y08-18-1999 _zload |
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| 090 | _aTK7874.75.D35 1991 4mikrofis | ||
| 090 |
_aTK7874.75 _b.D35 1991 |
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| 100 | 1 | _aDamianou, Christakis Andrea | |
| 245 | 1 | 0 |
_aCharacterization techniques for contaminated gate oxide _h[microform] / _cby Christakis Andrea Damianou |
| 260 |
_aAnn Arbor, Mich. : _bUniversity Microfilms International, _c1991 |
||
| 300 |
_a1 microfiche ; _c11 x 15 cm. |
||
| 502 | _aThesis (Ph.D.) - University of Arizona, 1990 | ||
| 650 | 0 |
_aIntegrated circuits _xVery large scale integration |
|
| 650 | 0 | _aMetal oxide semiconductors | |
| 907 |
_a.b10325384 _b2021-05-28 _c2019-11-12 |
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| 942 |
_c3 _n0 _kTK7874.75.D35 1991 4mikrofis |
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| 914 | _avtls000033966 | ||
| 990 | _ar | ||
| 991 | _aFakulti Sains Fizik dan Gunaan | ||
| 998 |
_at _b1999-05-08 _cm _da _feng _gmiu _y0 _z.b10325384 |
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| 999 |
_c34525 _d34525 |
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