| 000 | 00907nam a2200277 a 4500 | ||
|---|---|---|---|
| 005 | 20250930092401.0 | ||
| 008 | 981208s1970 nyua 000 0 eng | ||
| 010 | _a79-081607 | ||
| 039 | 9 |
_a200704181133 _bfati _y08-18-1999 _zload |
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| 090 | _aQC612.S4K26 | ||
| 090 |
_aQC612.S4 _bK26 |
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| 100 | 1 |
_aKane, Philip F., _d1920- _938979 |
|
| 245 | 1 | 0 |
_aCharacterization of semiconductor materials / _cPhilip F. Kane, Graydon B. Larrabee |
| 260 |
_aNew York : _bMcGraw-Hill, _c1970 |
||
| 300 |
_axvi, 351 p. : _bill. ; _c26 cm. |
||
| 440 | 0 | _aTexas instruments electronics series | |
| 650 | 0 | _aSemiconductors | |
| 700 | 1 |
_aLarrabee, Graydon B., _d1932- |
|
| 907 |
_a.b10325323 _b2021-05-28 _c2019-11-12 |
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| 942 |
_c01 _n0 _kQC612.S4K26 |
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| 914 | _avtls000033959 | ||
| 990 | _akh | ||
| 991 | _aFakulti Sains Fizik dan Gunaan | ||
| 998 |
_at _b1999-05-08 _cm _da _feng _gnyu _y0 _z.b10325323 |
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| 999 |
_c34519 _d34519 |
||