000			01250cam a22003135a 4500
005			20250914132635.0
008			040514s1997 xxua b 000 0 eng
010			_a2003-533030
020			_a0780310004 _cRM502.30
039		9	_a200407051323 _bhamka _c200406232105 _djamil _c200406232102 _djamil _c200406232048 _djamil _y05-14-2004 _zzakir
090			_aTK7895.M4S428 pasca
090			_aTK7895
100	1		_aSharma, Ashok K.
245	1	0	_aSemiconductor memories : _btechnology, testing, and reliability / _cAshok K. Sharma
260			_aNew York : _bIEEE (Institute of Electrical and Electronic Engineers), _c1997
300			_axii, 462 p. : _bill. ; _c26 cm.
500			_a'IEEE Solid-State Circuits Council, sponsor.'
504			_aIncludes bibliographical references and index
650		0	_aSemiconductor storage devices
710	2		_aIEEE Solid-State Circuits Council
856	4	2	_3Publisher description _uhttp://www.loc.gov/catdir/description/wiley039/2003533030.html
907			_a.b13376299 _b2021-05-28 _c2019-11-12
942			_c01 _n0 _kTK7895.M4S428 pasca
914			_avtls003289286
990			_ajj
991			_aPusat Pengajian Fizik Gunaan - Pasca
998			_al _b2004-01-05 _cm _da _feng _gxxu _y0 _z.b13376299
999			_c336976 _d336976