000 01122nam a22002894a 4500
005 20250914132423.0
008 040315s2003 xxua b 001 0 eng
020 _a1560329416 (alk. paper)
_cRM1179.85
039 9 _a201311251811
_blan
_c200404041316
_dhayat
_c200403241216
_dhamzah
_c200403150920
_dsanusi
_y03-15-2004
_zsanusi
040 _dUKM
090 _aQC611.6.O6M52
090 _aQC611.6.O6
_bM52
245 0 0 _aMicroprobe characterization of optoelectronic materials /
_cedited by Juan Jimenez.
260 _aNew York :
_bTaylor & Francis,
_c2003.
300 _axiv, 715 p. :
_bill. ;
_c24 cm.
440 0 _aOptoelectronic properties of semiconductors and superlattices ;
_vvol. 17.
504 _aIncludes bibliographical references and index.
650 0 _aSemiconductors
_xOptical properties.
650 0 _aMicroprobe analysis.
700 1 _aJimenez, J.
_q(Juan).
907 _a.b13346726
_b2021-05-28
_c2019-11-12
942 _c01
_n0
_kQC611.6.O6M52
914 _avtls003286168
991 _aFakulti Sains Sosial dan Kemanusiaan
998 _at
_b2004-02-03
_cm
_da
_feng
_gxxu
_y0
_z.b13346726
999 _c334059
_d334059