| 000 | 01215cam a22003254a 4500 | ||
|---|---|---|---|
| 005 | 20250914131109.0 | ||
| 008 | 030929s2003 xxka b 001 0 eng | ||
| 010 | _a2002-153114 | ||
| 020 |
_a0470847123 (cloth.) _cRM422.10 |
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| 020 |
_a0470847131 (pbk.) _cRM265.50 |
||
| 039 | 9 |
_a200704101502 _bjamil _c200310281220 _dhayat _c200310211428 _djamil _y09-29-2003 _zzakir |
|
| 090 | _aTP156.S95W375 | ||
| 090 |
_aTP156.S95 _bW375 |
||
| 100 | 1 | _aWatts, John F. | |
| 245 | 1 | 3 |
_aAn introduction to surface analysis by XPS and AES / _cJohn F. Watts, John Wolstenholme |
| 260 |
_aChichester, West Sussex, England : _bJohn Wiley, _c2003 |
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| 300 |
_ax, 212 p. : _bill. ; _c24 cm. |
||
| 504 | _aIncludes bibliographical references (p. [195]-202) and index | ||
| 650 | 0 |
_aSurfaces (Technology) _xAnalysis |
|
| 650 | 0 | _aElectron spectroscopy | |
| 700 | 1 | _aWolstenholme, John | |
| 856 | 4 | 1 |
_3Table of contents _uhttp://www.loc.gov/catdir/toc/wiley031/2002153114.html |
| 907 |
_a.b13270965 _b2021-05-28 _c2019-11-12 |
||
| 942 |
_c01 _n0 _kTP156.S95W375 |
||
| 914 | _avtls000341645 | ||
| 990 | _ajj | ||
| 991 | _aProgram Sains Sekitaran | ||
| 998 |
_al _at _b2003-03-09 _cm _da _feng _gxxk _y0 _z.b13270965 |
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| 999 |
_c326589 _d326589 |
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