000 01127nam a2200313 a 4500
005 20250930114344.0
007 he amd baau
008 021119s1986 xxk bm 0 eng
039 9 _a200708161634
_brashid
_y11-19-2002
_ztrainer
040 _aUKM
_erda
090 _amikrofis tesis QC176.83.H37 2002
090 _amikrofis tesis QC176.83
_b.H37 2002
100 0 _aHasan Adli Alwi,
_eauthor.
_937548
245 1 0 _aHigh resolution quartz crystal microbalance for thin film deposition measurements
_cby Hasan Adli Alwi.
260 _aBangi :
_bPerpustakaan Tun Seri Lanang,
_c1986
300 _a2 microfisches ;
_c11 x 15 cm.
336 _atext
_2rdacontent
337 _amicroform
_2rdamedia
338 _amicrofiche
_2rdacarrier
500 _aThesis (MSc)-University of Manchester, 1986
650 0 _aThin films.
907 _a.b13143244
_b2021-05-28
_c2019-11-12
942 _c3
_n0
_kmikrofis tesis QC176.83.H37 2002
914 _avtls000327535
990 _asnm
991 _aFakulti Sains Fizik dan Gunaan
991 _aFakulti Kejuruteraan
998 _at
_b2002-06-11
_cm
_dy
_feng
_gxxk
_y0
_z.b13143244
999 _c313943
_d313943