| 000 | 01131nam a2200301 a 4500 | ||
|---|---|---|---|
| 005 | 20250913093810.0 | ||
| 008 | 981208s1990 xxua b 001 eng | ||
| 020 | _a0471522775 | ||
| 039 | 9 |
_a200810111457 _bhayat _c200403032106 _ddiana _y08-18-1999 _zload |
|
| 090 | _aQA276.N45 | ||
| 090 | _aQA276 | ||
| 100 | 1 |
_aNelson, Wayne, _d1936- |
|
| 245 | 1 | 0 |
_aAccelerated testing : _bstatistical models, test plans, and data analyses / _cWayne Nelson |
| 260 |
_aNew York : _bJohn Wiley & Sons, _c1990 |
||
| 300 |
_axiv , 601 p. : _bill. ; _c25 cm. |
||
| 440 | 0 | _aWiley series in probability and mathematical statistics. Applied probability and statistics | |
| 500 | _a'A Wiley-Interscience publication.' | ||
| 504 | _aIncludes bibliographical references | ||
| 650 | 0 | _aFailure time data analysis | |
| 650 | 0 |
_aReliability (Engineering) _xStatistical methods |
|
| 650 | 0 |
_aAccelerated life testing _xStatistical methods |
|
| 907 |
_a.b10010919 _b2020-10-12 _c2019-11-11 |
||
| 942 |
_c01 _n0 _kQA276.N45 |
||
| 998 |
_at _b1999-05-08 _cm _da _feng _gxxu |
||
| 914 | _avtls000001184 | ||
| 991 | _aFakulti Sains Matematik | ||
| 999 |
_c3135 _d3135 |
||