000 01039nam a2200265 a 4500
005 20250930092224.0
007 he am baa
008 981208s1977 xxu bm 00 eng
039 9 _a200708161718
_brashid
_c200108201103
_dazman
_y08-18-1999
_zload
090 _amikrofis tesis QC611.8.G3V37
090 _amikrofis tesis QC611.8.G3
_bV37
100 1 _aVasudev, Prahalad K.,
_d1951-
245 1 0 _aCapacitance measurement techniques applied to the study of deep levels in galium arsenide ( microform) /
_cby Prahalad K. Vasudev
260 _aAnn Arbor, Mich. :
_bUniversity Microfilms International,
_c1977
300 _a2 microfiches ;
_c11 x 15 cm.
502 _aThesis (Ph.D.) - Stanford University, 1977
650 0 _aGallium arsenide semiconductors
_959810
907 _a.b10293085
_b2021-05-28
_c2019-11-12
942 _c3
_n0
_kmikrofis tesis QC611.8.G3V37
914 _avtls000030595
990 _ar
991 _aFakulti Sains Fizik dan Gunaan
998 _at
_b1999-05-08
_cm
_dy
_feng
_gxxu
_y0
_z.b10293085
999 _c31306
_d31306