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| 005 | 20250930092224.0 | ||
| 007 | he am baa | ||
| 008 | 981208s1977 xxu bm 00 eng | ||
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_a200708161718 _brashid _c200108201103 _dazman _y08-18-1999 _zload |
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| 090 | _amikrofis tesis QC611.8.G3V37 | ||
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| 100 | 1 |
_aVasudev, Prahalad K., _d1951- |
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| 245 | 1 | 0 |
_aCapacitance measurement techniques applied to the study of deep levels in galium arsenide ( microform) / _cby Prahalad K. Vasudev |
| 260 |
_aAnn Arbor, Mich. : _bUniversity Microfilms International, _c1977 |
||
| 300 |
_a2 microfiches ; _c11 x 15 cm. |
||
| 502 | _aThesis (Ph.D.) - Stanford University, 1977 | ||
| 650 | 0 |
_aGallium arsenide semiconductors _959810 |
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| 907 |
_a.b10293085 _b2021-05-28 _c2019-11-12 |
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| 942 |
_c3 _n0 _kmikrofis tesis QC611.8.G3V37 |
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| 914 | _avtls000030595 | ||
| 990 | _ar | ||
| 991 | _aFakulti Sains Fizik dan Gunaan | ||
| 998 |
_at _b1999-05-08 _cm _dy _feng _gxxu _y0 _z.b10293085 |
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_c31306 _d31306 |
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